国产精品一级18一级毛片_亚洲日韩在线观看亚洲专区_九九视频精品在线6_奇米影视第四狠狠&_日本人妻激情澎湃_99久久综合精品网站亚洲_亚州中文Av在线_午夜一级毛片免费看_做暧暧的视频完整视频免费_欧美成人亚洲日韩一区二区

“開放靈活的平臺” T2000——滿足多樣化測試需求的解決方案

SoC測試系統(tǒng)T2000產品革新是時代進步的標志。隨著SoC器件的生命周期不斷縮短，芯片制造商以往需要兩到三年就購買新的測試設備或新一代的產品的情況已經改變，有了更具成本優(yōu)勢的新選擇。
T2000系統(tǒng)能使客戶用最小的投資，最短的時間來實現(xiàn)新產品的量產化，并推向市場。
T2000系統(tǒng)是為不斷變化的市場需求推出的革新化的解決方案。

• Features
• Solution
• Scalability

SoC測試系統(tǒng)T2000Features

While chipmakers enhance the functionality of semiconductor devices and increase multi-functionality, they need to reduce development times. The T2000 is ideal for testing these devices.

Time to Market Reduction - Multi-Session

The T2000 makes it possible to develop device test programs efficiently with minimal investment. With the multi-site CPU architecture unique to the T2000, multiple users can log in to a single test system at the same time, and perform debugging work independently. Up to eight people can work at the same time, contributing to both engineering cost savings and TTM reduction. In addition, eight people can develop separate functions for the same device at the same time, greatly shortening development times.

Best-In-Class Parallel Test Efficiency - Multi-Site Controller

As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase, and in general test times tend to be longer. However, the T2000 reduces test time and achieves high throughput with highly efficient multi-site test technology which completely eliminates overhead.

Test Time Reduction - Concurrent Test

The T2000 supports concurrent test functionality which can execute complicated device test in shorter times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly switch between sequential execution and parallel execution of multiple test items. In addition, its concurrent test functionality enables users to rapidly develop test programs with short test times.

Test Cost Reduction

With up to 8,192 digital channels, the T2000 achieves more than twice the parallelism of the previous model, reducing test cost.